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IC High-temperature Dynamic Burn-in System
Discrete Semiconductor HTRB System
Discrete Semiconductor Operating Life System
Diode Full Operating Life System
Diode Full Dynamic Operating Life System
High-power Transistor Operating Life System
Capacitor Quality Burn-in System
Bridge Rectifier Quality Buin-in System
Regulator n./Module Operating Life System
IC High-temperature Dynamic Burn-in System
Test circuitry and test condition of the system accord with MIL-SYD-883D,GJB548 standard.
Products:
[1-1]HTI-3000N
Mostly spec and capability table
Accessory
Burn-in Systems
Power Supplies
Test Sockets
